Temperature sensitivity of Ge-B-SiO₂ waveguide Bragg gratings on a crystallized glass substrate

Kintaka, K., Nishii, J., Kawamoto, Y., Sakamoto, A. and Kazansky, P.G. (2002) Temperature sensitivity of Ge-B-SiO₂ waveguide Bragg gratings on a crystallized glass substrate. Optics Letters, 27 (16), 1394-1396. (doi:10.1364/OL.27.001394).

Abstract

Waveguide Bragg gratings were fabricated by plasma-enhanced chemical-vapor deposition followed by irradiation with KrF excimer laser light through a phase mask. The period of the Bragg grating was 0.53 µm, and the Bragg wavelength was 1.53 µm. The temperature dependence of the Bragg wavelength was 11 pm/°C for a 10 GeO₂ - 90SiO2 (mol.%) core waveguide on a Si substrate, and the Bragg wavelength shift was successfully reduced to 5.0 pm/°C by use of a 14GeO₂ - 12B₂O₃ - 74SiO₂ (mol.%) core and a crystallized glass substrate with a thermal-expansion coefficient of -2.0 x 10^-6 (/°C).

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