Characterization of molecular and atomic oxygen ZnO thick film sensor by impedance spectroscopy
Characterization of molecular and atomic oxygen ZnO thick film sensor by impedance spectroscopy
Valer, J.C
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Roberts, G.T
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Chambers, A.R.
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Owen, J.R
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Roberts, M.R
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September 2009
Valer, J.C
5cba9627-842d-4cd6-a404-04b41c9348de
Roberts, G.T
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Chambers, A.R.
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Owen, J.R
854d6948-ba91-47de-987d-64e5bf4a7fca
Roberts, M.R
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Valer, J.C, Roberts, G.T, Chambers, A.R., Owen, J.R and Roberts, M.R
(2009)
Characterization of molecular and atomic oxygen ZnO thick film sensor by impedance spectroscopy.
11th International Symposium on Materials in a Space Environment, , Aix-en-Provence, France.
14 - 17 Sep 2009.
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Published date: September 2009
Venue - Dates:
11th International Symposium on Materials in a Space Environment, , Aix-en-Provence, France, 2009-09-14 - 2009-09-17
Organisations:
Aerodynamics & Flight Mechanics
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Local EPrints ID: 155349
URI: http://eprints.soton.ac.uk/id/eprint/155349
PURE UUID: ba2a4328-7753-4739-bba8-3c768ac1a202
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Date deposited: 28 May 2010 12:53
Last modified: 10 Dec 2021 18:13
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Contributors
Author:
J.C Valer
Author:
G.T Roberts
Author:
A.R. Chambers
Author:
J.R Owen
Author:
M.R Roberts
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