How scattering can compromise Raman depth profiling data


Wyeth, P., Macdonald, A.M. and Vaughan, A.S. (2003) How scattering can compromise Raman depth profiling data. In, Raman Spectroscopy of Materials, Institute of Physics, London, UK, 15 Jan 2003. London, UK, Institute of Physics.

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Item Type: Conference or Workshop Item (Paper)
Keywords: scattering, compromise, Raman spectroscopy, depth profiling data
Subjects: Q Science > QC Physics
Divisions: University Structure - Pre August 2011 > School of Art
Item ID: 16474
Date Deposited: 08 Aug 2005
Last Modified: 02 Mar 2012 11:44
Contributors: Wyeth, P. (Author)
Macdonald, A.M. (Author)
Vaughan, A.S. (Author)
Date: 2003
Status: Published
Publisher: Institute of Physics
URI: http://eprints.soton.ac.uk/id/eprint/16474

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