A description of the scanning electrochemical microscope (SECM) and of its applications
Denuault, G., Frank, M.H.T. and Nugues, S. (1995) A description of the scanning electrochemical microscope (SECM) and of its applications. In, Nanoscale Probes of the Solid/Liquid Interface. Nanoscale Probes of the Solid/Liquid InterfaceProceedings of the NATO Advanced Study Institute, Sophia Antipolis, France, July 10--20, 1993. London, GB, Springer, 69-82. (NATO Science Series E, 288).
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| Item Type: | Book Section |
|---|---|
| Additional Information: | BE53V |
| ISBNs: | 9780792334545 (hardback) 9789048145416 (paperback) |
| Related URLs: | |
| Subjects: | Q Science > QD Chemistry T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | University Structure - Pre August 2011 > School of Chemistry |
| Item ID: | 179267 |
| Date Deposited: | 08 Apr 2011 15:01 |
| Last Modified: | 02 Mar 2012 13:16 |
| Contributors: | Denuault, G. (Author) Frank, M.H.T. (Author) Nugues, S. (Author) |
| Date: | 1995 |
| Additional Information: | BE53V |
| Status: | Published |
| Publisher: | Springer |
| URI: | http://eprints.soton.ac.uk/id/eprint/179267 |
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