Scanning electrochemical microscope (SECM) study of the relationship between proton concentration and electronic charge as a function of ionic strength during the oxidation of polyaniline


Frank, Maria Helena Troise and Denuault, Guy (1994) Scanning electrochemical microscope (SECM) study of the relationship between proton concentration and electronic charge as a function of ionic strength during the oxidation of polyaniline. Journal of Electroanalytical Chemistry, 379, (1-2), 399-406. (doi:10.1016/0022-0728(94)87163-9).

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Description/Abstract

The SECM has been used to investigate the influence of ionic strength on the ingress and egress of protons to and from a polyaniline (PANI) film. This was done in solutions containing 0.01 mol dm(-3) HCl, with concentrations of NaCl ranging from 0 to 0.5 mol dm(-3), by measuring the steady-state faradaic current for H+ reduction on a 18 mu m diameter Pt microdisc located within few micrometres of the PANI film while cycling the potential of the film through the different oxidation states. The microelectrode response was calibrated using microdiscs of various sizes in different solutions of HCl, with and without the presence of supporting electrolyte. This investigation shows the influence of ionic strength on the film mechanism and in particular on the relationship between the behaviour of H+ at the film\solution interface and the behaviour of electrons at the film\electrode interface.

Item Type: Article
ISSNs: 1572-6657 (print)
1873-2569 (electronic)
Keywords: scanning electrochemical microscope, ionic strength, oxidation, polyaniline
Subjects: Q Science > QD Chemistry
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: University Structure - Pre August 2011 > School of Chemistry
ePrint ID: 179271
Date Deposited: 31 Mar 2011 13:38
Last Modified: 27 Mar 2014 19:32
URI: http://eprints.soton.ac.uk/id/eprint/179271

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