Scanning electrochemical microscopy: potentiometric probing of ion fluxes

Denuault, G., Frank, M.H.T. and Peter, L.M. (1992) Scanning electrochemical microscopy: potentiometric probing of ion fluxes. Faraday Discussions, (94), 23-35. (doi:10.1039/FD9929400023).


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The scanning electrochemical microscope has been used to probe the diffusion layer by measuring the potential difference between a large reference electrode located in the bulk of the solution and a microindicator electrode positioned a few mum away from a substrate electrode. Ag micro-discs (10 and 50 mum diameter) have been used as potentiometric sensors to probe the concentration profile due to the diffusion of Ag+ to and from a planar Ag electrode. A similar experiment was carried out with an Ag microcylinder (50 mum diameter) as substrate electrode. In a separate set of experiments, Ag/AgCl microdiscs (10 and 50 mum diameter) were used to monitor the flux of Cl- consumed and generated by a film of polyaniline electrodeposited on Pt. The tip potential was recorded while cycling the potential of the PANI film past the first oxidation peak. Direct measurement of the ingress and egress of Cl- ions supports previously reported mechanisms for the oxidation of PANI films.

Item Type: Article
Digital Object Identifier (DOI): doi:10.1039/FD9929400023
Additional Information: MA449
ISSNs: 1359-6640 (print)
1364-5498 (electronic)
Keywords: diffusion layer, beam deflection, microelectrode probe, polyaniline, behavior, ph, voltammetry, resolution, electrodes, reduction
Subjects: Q Science > QD Chemistry
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions : University Structure - Pre August 2011 > School of Chemistry
ePrint ID: 179275
Accepted Date and Publication Date:
Date Deposited: 08 Apr 2011 08:42
Last Modified: 31 Mar 2016 13:35

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