An investigation of the parameters determining the drift and low frequency noise characteristics of thick film sensors


Sion, R., Zhang, Z. and Atkinson, J. (1997) An investigation of the parameters determining the drift and low frequency noise characteristics of thick film sensors. In, Proceedings of Eurosensors XI, Warsaw, Poland, 21 - 24 Sep 1997. , 239-241.

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Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: University Structure - Pre August 2011 > School of Engineering Sciences
ePrint ID: 21239
Date Deposited: 15 Nov 2006
Last Modified: 27 Mar 2014 18:10
URI: http://eprints.soton.ac.uk/id/eprint/21239

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