An investigation of the parameters determining the drift and low frequency noise characteristics of thick film sensors
Sion, R., Zhang, Z. and Atkinson, J. (1997) An investigation of the parameters determining the drift and low frequency noise characteristics of thick film sensors. In, Proceedings of Eurosensors XI, Warsaw, Poland, 21 - 24 Sep 1997. , 239-241.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | University Structure - Pre August 2011 > School of Engineering Sciences |
| Item ID: | 21239 |
| Date Deposited: | 15 Nov 2006 |
| Last Modified: | 02 Mar 2012 12:26 |
| Contributors: | Sion, R. (Author) Zhang, Z. (Author) Atkinson, J. (Author) |
| Date: | 1997 |
| Status: | Published |
| URI: | http://eprints.soton.ac.uk/id/eprint/21239 |
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