A model to describe intermittency phenomena in electrical connectors


Maul, C. and McBride, J.W. (2002) A model to describe intermittency phenomena in electrical connectors. In, Forty-Eighth IEEE Holm Conference on Electrical Contacts, Orlando, USA, 21 - 23 Oct 2002. USA, Institute of Electrical and Electronics Engineers, 165-174.

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Description/Abstract

Fretting is known to be a major cause of contact deterioration and failure, particularly in tin-plated contacts. During fretting the contact resistance generally increases slowly with time. Superimposed to this slow increase in contact resistance are rapid changes in contact resistance within fractions of a second, called intermittences or short duration discontinuities.

Hi-speed measurements of contact voltage-drop and contact current have been carried out and the results are evaluated using general contact theory. It is shown that sudden changes in contact resistance can be caused by a surface film and by melting of current carrying asperities.

Item Type: Conference or Workshop Item (Paper)
Keywords: intermittence, intermittency phenomena, discontinuity, contact resistance, fretting corrosion, tin-plating
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TA Engineering (General). Civil engineering (General)
Divisions: University Structure - Pre August 2011 > School of Engineering Sciences
Item ID: 22114
Date Deposited: 05 Jun 2006
Last Modified: 01 Jun 2011 01:52
Contributors: Maul, C. (Author)
McBride, J.W. (Author)
Date: October 2002
Status: Published
Publisher: Institute of Electrical and Electronics Engineers
URI: http://eprints.soton.ac.uk/id/eprint/22114

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