A model to describe intermittency phenomena in electrical connectors
Maul, C. and McBride, J.W. (2002) A model to describe intermittency phenomena in electrical connectors. In, Forty-Eighth IEEE Holm Conference on Electrical Contacts, Orlando, USA, 21 - 23 Oct 2002. USA, Institute of Electrical and Electronics Engineers, 165-174.
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Fretting is known to be a major cause of contact deterioration and failure, particularly in tin-plated contacts. During fretting the contact resistance generally increases slowly with time. Superimposed to this slow increase in contact resistance are rapid changes in contact resistance within fractions of a second, called intermittences or short duration discontinuities.
Hi-speed measurements of contact voltage-drop and contact current have been carried out and the results are evaluated using general contact theory. It is shown that sudden changes in contact resistance can be caused by a surface film and by melting of current carrying asperities.
|Item Type:||Conference or Workshop Item (Paper)|
|Keywords:||intermittence, intermittency phenomena, discontinuity, contact resistance, fretting corrosion, tin-plating|
|Subjects:||T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TA Engineering (General). Civil engineering (General)
|Divisions:||University Structure - Pre August 2011 > School of Engineering Sciences
|Date Deposited:||05 Jun 2006|
|Last Modified:||01 Jun 2011 01:52|
|Contributors:||Maul, C. (Author)
McBride, J.W. (Author)
|Publisher:||Institute of Electrical and Electronics Engineers|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
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