A model to describe intermittency phenomena in electrical connectors
Maul, C. and McBride, J.W. (2002) A model to describe intermittency phenomena in electrical connectors. In, Forty-Eighth IEEE Holm Conference on Electrical Contacts, Orlando, USA, 21 - 23 Oct 2002. USA, Institute of Electrical and Electronics Engineers, 165-174.
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Description/Abstract
Fretting is known to be a major cause of contact deterioration and failure, particularly in tin-plated contacts. During fretting the contact resistance generally increases slowly with time. Superimposed to this slow increase in contact resistance are rapid changes in contact resistance within fractions of a second, called intermittences or short duration discontinuities.
Hi-speed measurements of contact voltage-drop and contact current have been carried out and the results are evaluated using general contact theory. It is shown that sudden changes in contact resistance can be caused by a surface film and by melting of current carrying asperities.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Keywords: | intermittence, intermittency phenomena, discontinuity, contact resistance, fretting corrosion, tin-plating |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering T Technology > TA Engineering (General). Civil engineering (General) |
| Divisions: | University Structure - Pre August 2011 > School of Engineering Sciences |
| Item ID: | 22114 |
| Date Deposited: | 05 Jun 2006 |
| Last Modified: | 01 Jun 2011 01:52 |
| Contributors: | Maul, C. (Author) McBride, J.W. (Author) |
| Date: | October 2002 |
| Status: | Published |
| Publisher: | Institute of Electrical and Electronics Engineers |
| URI: | http://eprints.soton.ac.uk/id/eprint/22114 |
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