An explanation of thermal behaviour of thick film strain gauges
Zheng, Yulan, Atkinson, John and Sion, Russell (2003) An explanation of thermal behaviour of thick film strain gauges. Journal of Physics D: Applied Physics, 36, (9), 1153-1158. (doi:10.1088/0022-3727/36/9/314).
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Earlier study shows that resistor thickness of the thick film strain gauge can affect its temperature characteristic, which is usually a roughly parabolic curve. Thicker resistors tend to exhibit a higher positive temperature coefficient of resistance (TCR) and a lower T&min;, the temperature at which the TCR changes to zero in the curve. This paper presents a possible explanation of this observation based on an analysis of strain profiles and resistivity behaviour difference in resistors with different thicknesses subjected to temperature variation.
|Digital Object Identifier (DOI):||doi:10.1088/0022-3727/36/9/314|
|Subjects:||T Technology > T Technology (General)
Q Science > QC Physics
|Divisions :||University Structure - Pre August 2011 > School of Engineering Sciences
|Accepted Date and Publication Date:||
|Date Deposited:||27 Mar 2006|
|Last Modified:||31 Mar 2016 11:42|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
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