An explanation of thermal behaviour of thick film strain gauges
Zheng, Yulan, Atkinson, John and Sion, Russell (2003) An explanation of thermal behaviour of thick film strain gauges. Journal of Physics D: Applied Physics, 36, (9), 1153-1158. (doi: 10.1088/0022-3727/36/9/314).
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Description/Abstract
Earlier study shows that resistor thickness of the thick film strain gauge can affect its temperature characteristic, which is usually a roughly parabolic curve. Thicker resistors tend to exhibit a higher positive temperature coefficient of resistance (TCR) and a lower T&min;, the temperature at which the TCR changes to zero in the curve. This paper presents a possible explanation of this observation based on an analysis of strain profiles and resistivity behaviour difference in resistors with different thicknesses subjected to temperature variation.
| Item Type: | Article |
|---|---|
| ISSNs: | 0022-3727 (print) |
| Related URLs: | |
| Subjects: | T Technology > T Technology (General) Q Science > QC Physics |
| Divisions: | University Structure - Pre August 2011 > School of Engineering Sciences |
| Item ID: | 22572 |
| Date Deposited: | 27 Mar 2006 |
| Last Modified: | 02 Mar 2012 12:04 |
| Contributors: | Zheng, Yulan (Author) Atkinson, John (Author) Sion, Russell (Author) |
| Date: | April 2003 |
| Status: | Published |
| Contact Email Address: | jka@soton.ac.uk |
| URI: | http://eprints.soton.ac.uk/id/eprint/22572 |
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