Intermittency events in bio-compatible electrical contacts


McBride, J.W. and Maul, C. (2005) Intermittency events in bio-compatible electrical contacts. In, Proceedings of the Fifty-First IEEE Holm Conference on Electrical Contacts, 2005. Fifty-First IEEE Holm Conference on Electrical Contacts USA, Institute of Electrical and Electronics Engineers, 75-81. (doi:10.1109/HOLM.2005.1518226).

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Description/Abstract

This paper presents a study of the electrical contact performance of bio-compatible electrical connectors. In particular, the focus is on the performance of these devices under low frequency fretting conditions aimed to replicate the types of motion that may be experienced in-vivo. In the study, the contact materials selected include titanium, stainless-steel and cobalt-chromium alloys in various combinations. These materials are investigated under a unique methodology developed to include the high-frequency sampling of contact resistance values under dry-circuit conditions (20mV) and under low voltage levels of 5V. The experimental methodology is discussed in determining the best standard for continuing studies that compare relative performance. In all tests, the materials exhibit measurable intermittency events, after a low number of fretting cycles. These events are discussed and related to the surface form exhibited and measured using 3D surface scanning methods. The results are then related to theoretical studies of intermittency.

Item Type: Book Section
ISBNs: 0780391136 (hardback)
Related URLs:
Keywords: biomedical electronics, chromium alloys, cobalt alloys, contact resistance, electric connectors, electrical contacts, materials testing, stainless steel, titanium alloys, wear
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TN Mining engineering. Metallurgy
Q Science > QH Natural history > QH301 Biology
Divisions: University Structure - Pre August 2011 > School of Engineering Sciences
ePrint ID: 23367
Date Deposited: 28 Mar 2006
Last Modified: 27 Mar 2014 18:12
Publisher: Institute of Electrical and Electronics Engineers
URI: http://eprints.soton.ac.uk/id/eprint/23367

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