Microstructural studies of copper incorporated amorphous carbon nitride films


Jiang, Liudi, Fitzgerald, A.G. and Rose, M.J. (2002) Microstructural studies of copper incorporated amorphous carbon nitride films. Physica Status Solidi (a), 189, (1), 203-207. (doi:10.1002/1521-396X(200201)189:1<203::AID-PSSA203>3.0.CO;2-D).

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Description/Abstract

The effects of the incorporation of copper on the microstructure of amorphous carbon nitride films has been studied. Copper incorporated amorphous carbon nitride films (a-C : N : Cu) with different copper concentrations have been prepared by a magnetron co-sputtering technique. Both X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy (FTIR) have been used to characterise the bonding structures in the films. It is found that the N/(N+C) atomic ratio increases due to the incorporation of copper. The results also show that copper incorporation promotes formation of the sp3-bonded carbon nitrogen phase. The diamond nucleation in a-C : N : Cu films, which is determined from the observation of two-phonon diamond absorption FTIR bands, has been ascribed to the favorable formation of the sp3-bonded carbon nitrogen phase in the a-C : N : Cu films.

Item Type: Article
ISSNs: 0031-8965 (print)
Related URLs:
Keywords: 61.43.Dq, 68.55.Nq, S7.14
Subjects: T Technology > T Technology (General)
Q Science > QC Physics
Divisions: University Structure - Pre August 2011 > School of Engineering Sciences
University Structure - Pre August 2011 > School of Physics and Astronomy
ePrint ID: 23551
Date Deposited: 28 Mar 2006
Last Modified: 27 Mar 2014 18:12
URI: http://eprints.soton.ac.uk/id/eprint/23551

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