Physical modelling of the enhanced diffusion of boron due to ion implantation in thin base npn bipolar transistors


Mouis, M, Gregory, H J, Denorme, S, Mathiot, D, Ashburn, P, Robbins, D J and Glasper, J L (1995) Physical modelling of the enhanced diffusion of boron due to ion implantation in thin base npn bipolar transistors. Microelectronics Journal, 26, 255-259.

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Item Type: Other
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 250940
Date Deposited: 04 Oct 1999
Last Modified: 02 Mar 2012 12:57
Contributors: Mouis, M (Author)
Gregory, H J (Author)
Denorme, S (Author)
Mathiot, D (Author)
Ashburn, P (Author)
Robbins, D J (Author)
Glasper, J L (Author)
Date: 1995
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/250940

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