New time-of-flight technique for measuring drift velocity in Semiconductors
Evans, A G R, Robson, P N and Stubbs, M G (1972) New time-of-flight technique for measuring drift velocity in Semiconductors. Electron.Letts., 8, 159-196.
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| Item Type: | Other |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 250984 |
| Date Deposited: | 08 Oct 1999 |
| Last Modified: | 02 Mar 2012 13:17 |
| Contributors: | Evans, A G R (Author) Robson, P N (Author) Stubbs, M G (Author) |
| Date: | 1972 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/250984 |
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