New time-of-flight technique for measuring drift velocity in Semiconductors


Evans, A G R, Robson, P N and Stubbs, M G (1972) New time-of-flight technique for measuring drift velocity in Semiconductors. Electron.Letts., 8, 159-196.

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Item Type: Other
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 250984
Date Deposited: 08 Oct 1999
Last Modified: 27 Mar 2014 19:52
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/250984

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