Drift mobility measurement in thin epitaxial semiconductor layers using time-of-flight techniques


Evans, A G R and Robson, P N (1974) Drift mobility measurement in thin epitaxial semiconductor layers using time-of-flight techniques. Solid State Electron, 17, 805-812.

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Item Type: Other
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 250985
Date Deposited: 08 Oct 1999
Last Modified: 27 Mar 2014 19:52
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/250985

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