Drift mobility measurement in thin epitaxial semiconductor layers using time-of-flight techniques
Evans, A G R and Robson, P N (1974) Drift mobility measurement in thin epitaxial semiconductor layers using time-of-flight techniques. Solid State Electron, 17, 805-812.
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| Item Type: | Other |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 250985 |
| Date Deposited: | 08 Oct 1999 |
| Last Modified: | 02 Mar 2012 14:01 |
| Contributors: | Evans, A G R (Author) Robson, P N (Author) |
| Date: | 1974 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/250985 |
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