Increase of low frequency noise generating defects in todays CMOS/BICOM technologies


Murray, D C, Siabi-Shahrivar, N, Evans, A G R, Carter, J C and Redman-White, W (1989) Increase of low frequency noise generating defects in todays CMOS/BICOM technologies. Mat.Sci & Eng., B4, 367-372.

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Item Type: Other
Divisions : Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 251019
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1989Published
Date Deposited: 11 Oct 1999
Last Modified: 31 Mar 2016 13:51
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251019

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