Increase of low frequency noise generating defects in todays CMOS/BICOM technologies
Murray, D C, Siabi-Shahrivar, N, Evans, A G R, Carter, J C and Redman-White, W (1989) Increase of low frequency noise generating defects in todays CMOS/BICOM technologies. Mat.Sci & Eng., B4, 367-372.
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| Item Type: | Other |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 251019 |
| Date Deposited: | 11 Oct 1999 |
| Last Modified: | 02 Mar 2012 13:17 |
| Contributors: | Murray, D C (Author) Siabi-Shahrivar, N (Author) Evans, A G R (Author) Carter, J C (Author) Redman-White, W (Author) |
| Date: | 1989 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/251019 |
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