Shallow defects responsible for G-R noise in MOSFETS


Murray, D C, Evans, A G R and Carter, J C (1991) Shallow defects responsible for G-R noise in MOSFETS. IEEE ED, 38, (2), 407-415.

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Item Type: Other
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 251030
Date Deposited: 11 Oct 1999
Last Modified: 27 Mar 2014 19:52
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251030

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