Shallow defects responsible for G-R noise in MOSFETS


Murray, D C, Evans, A G R and Carter, J C (1991) Shallow defects responsible for G-R noise in MOSFETS. IEEE ED, 38, (2), 407-415.

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Item Type: Other
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 251030
Date Deposited: 11 Oct 1999
Last Modified: 02 Mar 2012 12:18
Contributors: Murray, D C (Author)
Evans, A G R (Author)
Carter, J C (Author)
Date: 1991
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251030

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