Fabrication of improved piezoresitive Si cantilever probes for the atomic force microscope


Su, Y, Evans, A G R, Brunnschweiler, A, Ensell, G and Koch, M (1997) Fabrication of improved piezoresitive Si cantilever probes for the atomic force microscope. Sensors and Actuators, A60, 163-167.

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Item Type: Other
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 251168
Date Deposited: 13 Oct 1999
Last Modified: 02 Mar 2012 12:57
Contributors: Su, Y (Author)
Evans, A G R (Author)
Brunnschweiler, A (Author)
Ensell, G (Author)
Koch, M (Author)
Date: 1997
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251168

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