Study of Hall and effective mobilities in pseudomorphic Si-IXGex P-Channel metal-oxide semiconductor field-effect transistors at room temperature and 4.2K.


Lander, R J P, Emeleus, C J, McGregor, B M, Parker, E H C, Whall, T E, Evans, A G R and Kennedy, G P (1997) Study of Hall and effective mobilities in pseudomorphic Si-IXGex P-Channel metal-oxide semiconductor field-effect transistors at room temperature and 4.2K. J.Appl. Phys, 82, ((10)), 5210-5216.

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Item Type: Other
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 251178
Date Deposited: 14 Oct 1999
Last Modified: 02 Mar 2012 14:01
Contributors: Lander, R J P (Author)
Emeleus, C J (Author)
McGregor, B M (Author)
Parker, E H C (Author)
Whall, T E (Author)
Evans, A G R (Author)
Kennedy, G P (Author)
Date: 1997
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251178

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