Electrical method for measuring the emitter depth of shallow bipolar transistors


Post, IRC and Ashburn, P (1990) Electrical method for measuring the emitter depth of shallow bipolar transistors. Electronics Letters, 26, 30-31.

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Item Type: Other
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 251831
Date Deposited: 09 Nov 1999
Last Modified: 27 Mar 2014 19:53
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251831

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