Test Stimulus Generation for Steady-State Analysis of Analogue and Mixed-signal Circuits


Chalk, C., Zwolinski, M. and Wilkins, B.R. (1997) Test Stimulus Generation for Steady-State Analysis of Analogue and Mixed-signal Circuits.

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Item Type: Other
Additional Information: 3rd IEEE International Mixed Signal Testing Workshop
Divisions : Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 251844
Accepted Date and Publication Date:
Status
1997Published
Date Deposited: 12 Nov 1999
Last Modified: 31 Mar 2016 13:52
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251844

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