Increase of low frequency noise generating defects in today's CMOS/BICMOS technologies


Murray, D C, Siabi-Shahrivar, N, Carter, J C, Evans, A G R and Redman-White, W (1989) Increase of low frequency noise generating defects in today's CMOS/BICMOS technologies.

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Item Type: Other
Additional Information: Address: Strasbourg
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 252069
Date Deposited: 09 Dec 1999
Last Modified: 27 Mar 2014 19:53
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/252069

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