Increase of low frequency noise generating defects in today's CMOS/BICMOS technologies
Murray, D C, Siabi-Shahrivar, N, Carter, J C, Evans, A G R and Redman-White, W (1989) Increase of low frequency noise generating defects in today's CMOS/BICMOS technologies.
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| Item Type: | Other |
|---|---|
| Additional Information: | Address: Strasbourg |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 252069 |
| Date Deposited: | 09 Dec 1999 |
| Last Modified: | 02 Mar 2012 11:38 |
| Contributors: | Murray, D C (Author) Siabi-Shahrivar, N (Author) Carter, J C (Author) Evans, A G R (Author) Redman-White, W (Author) |
| Date: | June 1989 |
| Additional Information: | Address: Strasbourg |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/252069 |
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