An investigation into the effects of RTA processing on low frequency noise and other characteristics of CMOSFETS
Murray, D C, Evans, A G R, Altrip, J L, Carter, J C and Gougam, A (1989) An investigation into the effects of RTA processing on low frequency noise and other characteristics of CMOSFETS. , 557-560.
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| Item Type: | Other |
|---|---|
| Additional Information: | Address: Berlin |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 252071 |
| Date Deposited: | 09 Dec 1999 |
| Last Modified: | 02 Mar 2012 11:38 |
| Contributors: | Murray, D C (Author) Evans, A G R (Author) Altrip, J L (Author) Carter, J C (Author) Gougam, A (Author) |
| Date: | September 1989 |
| Additional Information: | Address: Berlin |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/252071 |
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