Fabrication of improved piezoresistive Si cantilever probe for the atomic force microscope
Su, Y, Evans, A G R, Brunnschweiler, A and Ensell, G (1996) Fabrication of improved piezoresistive Si cantilever probe for the atomic force microscope.
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| Item Type: | Other |
|---|---|
| Additional Information: | UK Scanned probe Microscopy Meeting. Address: St Johns College, Oxford |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 252442 |
| Date Deposited: | 28 Jan 2000 |
| Last Modified: | 02 Mar 2012 11:38 |
| Contributors: | Su, Y (Author) Evans, A G R (Author) Brunnschweiler, A (Author) Ensell, G (Author) |
| Date: | April 1996 |
| Additional Information: | UK Scanned probe Microscopy Meeting. Address: St Johns College, Oxford |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/252442 |
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