A sutdy of Hall and field effect mobilities in a Si/Si0.8Ge0.2 p channel MOS heterostructure


Lander, R J P, Emeleus, C J, Parker, E H C, Whall, T E, Kennedy, G P, Sidek, R and Evans, A G R (1996) A sutdy of Hall and field effect mobilities in a Si/Si0.8Ge0.2 p channel MOS heterostructure.

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Item Type: Other
Additional Information: MRS Spring 96 Meeting. Address: San Fransisco
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science
Item ID: 252444
Date Deposited: 28 Jan 2000
Last Modified: 01 Mar 2012 10:30
Contributors: Lander, R J P (Author)
Emeleus, C J (Author)
Parker, E H C (Author)
Whall, T E (Author)
Kennedy, G P (Author)
Sidek, R (Author)
Evans, A G R (Author)
Date: April 1996
Additional Information: MRS Spring 96 Meeting. Address: San Fransisco
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/252444

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