Characterisation of geometry dependence of SOI MOSFET thermal resistance and capacitance parameters
Tenbroek, B M, Lee, M S L, Redman-White, W, Bunyan, R J T and Uren, M J (1997) Characterisation of geometry dependence of SOI MOSFET thermal resistance and capacitance parameters. UNSPECIFIED
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Organisation: IEEE Silicon on Insulator Conference, California, USA |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 252994 |
| Date Deposited: | 19 Apr 2000 |
| Last Modified: | 02 Mar 2012 12:58 |
| Contributors: | Tenbroek, B M (Author) Lee, M S L (Author) Redman-White, W (Author) Bunyan, R J T (Author) Uren, M J (Author) |
| Date: | October 1997 |
| Additional Information: | Organisation: IEEE Silicon on Insulator Conference, California, USA |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/252994 |
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