Identification of thermal and electrical time constants in SOI MOSFETs from small signal measurements


Tenbroek, B M, Redman-White, W, Uren, M J, Lee, M S L and Ward, M C L (1993) Identification of thermal and electrical time constants in SOI MOSFETs from small signal measurements. UNSPECIFIED

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Organisation: Proc European Solid State Device Research Conference, Grenoble, France
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 253019
Date Deposited: 26 Apr 2000
Last Modified: 27 Mar 2014 19:55
Further Information:Google Scholar
ISI Citation Count:0
URI: http://eprints.soton.ac.uk/id/eprint/253019

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