Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs
Redman-White, W, Lee, M S L, Uren, M J and Tenbroek, B M (1993) Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs. UNSPECIFIED
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Organisation: Proc. European Conf. on Circuit Theory and Design, Davos, Switzerland |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 253021 |
| Date Deposited: | 26 Apr 2000 |
| Last Modified: | 02 Mar 2012 12:20 |
| Contributors: | Redman-White, W (Author) Lee, M S L (Author) Uren, M J (Author) Tenbroek, B M (Author) |
| Date: | August 1993 |
| Additional Information: | Organisation: Proc. European Conf. on Circuit Theory and Design, Davos, Switzerland |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/253021 |
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