A charge conserving SOS MOSFET model including radiation effects for circuit simulation


Howes, R, Redman-White, W, Nicols, K G, Bird, S, Robinson, M and Mole, P J (1991) A charge conserving SOS MOSFET model including radiation effects for circuit simulation. UNSPECIFIED

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Organisation: Proc Conference on Radiation Effects on Components and Semiconductors, Montpelier, France
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 253262
Date Deposited: 05 May 2000
Last Modified: 02 Mar 2012 12:39
Contributors: Howes, R (Author)
Redman-White, W (Author)
Nicols, K G (Author)
Bird, S (Author)
Robinson, M (Author)
Mole, P J (Author)
Date: September 1991
Additional Information: Organisation: Proc Conference on Radiation Effects on Components and Semiconductors, Montpelier, France
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/253262

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