Increased low frequency noise generating defects in today's CMOS/BICMOS technologies
Murray, D C, Siabi-Shahrivar, N, Evans, A G R, Redman-White, W, Carter, J C and Altrip, J L (1989) Increased low frequency noise generating defects in today's CMOS/BICMOS technologies. In, European Materials Research Conference, Strasbourg, France,
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Comms, Signal Processing & Control Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 253271 |
| Date Deposited: | 09 May 2000 |
| Last Modified: | 20 Nov 2012 09:27 |
| Contributors: | Murray, D C (Author) Siabi-Shahrivar, N (Author) Evans, A G R (Author) Redman-White, W (Author) Carter, J C (Author) Altrip, J L (Author) |
| Date: | May 1989 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/253271 |
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