Increased low frequency noise generating defects in today's CMOS/BICMOS technologies


Murray, D C, Siabi-Shahrivar, N, Evans, A G R, Redman-White, W, Carter, J C and Altrip, J L (1989) Increased low frequency noise generating defects in today's CMOS/BICMOS technologies. In, European Materials Research Conference, Strasbourg, France,

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Item Type: Conference or Workshop Item (Paper)
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Comms, Signal Processing & Control
Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 253271
Date Deposited: 09 May 2000
Last Modified: 27 Mar 2014 19:55
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/253271

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