Direct extraction of MOSFET dynamic thermal characteristics from standard transistor structures using small signal measurements


Redman-White, W, Lee, M S L, Tenbroek, B M, Uren, M J and Bunyan, R J T (1993) Direct extraction of MOSFET dynamic thermal characteristics from standard transistor structures using small signal measurements. IEE Electronic Letters, 29, (13), 1180-1181.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 253297
Date Deposited: 08 May 2000
Last Modified: 27 Mar 2014 19:55
Further Information:Google Scholar
ISI Citation Count:24
URI: http://eprints.soton.ac.uk/id/eprint/253297

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