Direct extraction of MOSFET dynamic thermal characteristics from standard transistor structures using small signal measurements
Redman-White, W, Lee, M S L, Tenbroek, B M, Uren, M J and Bunyan, R J T (1993) Direct extraction of MOSFET dynamic thermal characteristics from standard transistor structures using small signal measurements. IEE Electronic Letters, 29, (13), 1180-1181.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 253297 |
| Date Deposited: | 08 May 2000 |
| Last Modified: | 02 Mar 2012 12:40 |
| Contributors: | Redman-White, W (Author) Lee, M S L (Author) Tenbroek, B M (Author) Uren, M J (Author) Bunyan, R J T (Author) |
| Date: | June 1993 |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 24 |
| URI: | http://eprints.soton.ac.uk/id/eprint/253297 |
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