Measurement and analysis of small-signal drain admittance in SOS MOSFETs


Howes, R and Redman-White, W (1991) Measurement and analysis of small-signal drain admittance in SOS MOSFETs. Electronics Letters, 27, (24), 2290-2292.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 253298
Date Deposited: 08 May 2000
Last Modified: 27 Mar 2014 19:55
Further Information:Google Scholar
ISI Citation Count:1
URI: http://eprints.soton.ac.uk/id/eprint/253298

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