Measurement and analysis of small-signal drain admittance in SOS MOSFETs
Howes, R and Redman-White, W (1991) Measurement and analysis of small-signal drain admittance in SOS MOSFETs. Electronics Letters, 27, (24), 2290-2292.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO |
| Item ID: | 253298 |
| Date Deposited: | 08 May 2000 |
| Last Modified: | 02 Mar 2012 12:39 |
| Contributors: | Howes, R (Author) Redman-White, W (Author) |
| Date: | November 1991 |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 1 |
| URI: | http://eprints.soton.ac.uk/id/eprint/253298 |
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