Measurement of surface charge using the Pockels effect. (Invited Paper)
Lewin, P.L. (1998) Measurement of surface charge using the Pockels effect. (Invited Paper). IEE Colloquium (98/235) Surface Phenomena Affecting Insulator Performance. , 1-3.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Chapter: 8 Organisation: IEE |
| ISSNs: | 0963-3308 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 253586 |
| Date Deposited: | 26 Jun 2003 |
| Last Modified: | 01 Mar 2012 10:37 |
| Contributors: | Lewin, P.L. (Author) |
| Date: | January 1998 |
| Additional Information: | Chapter: 8 Organisation: IEE |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/253586 |
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