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There is an alternative version of the item you are trying to access:
Kim, Dong-Hun, Park, Il-Han., Shin, Myoung-Chul and Sykulski, J.K. (2002) Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours. CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Perugia, Italy. 15 - 18 Jun 2002. p. 295 .

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