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Kim, Dong-Hun, Park, Il-Han., Shin, Myoung-Chul and Sykulski, J.K.
(2002)
Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours.
CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Perugia, Italy.
15 - 18 Jun 2002.
p. 295
.
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