A procedure for validating the use of lathed tapes for electrical breakdown tests
Blacker, R. S., Vaughan, A. S., Bassett, D. C., Moody, S. M. and Hampton, R. N. (1995) A procedure for validating the use of lathed tapes for electrical breakdown tests. Proceedings of 5th International Conference on Conduction and Breakdown of Solid Dielectrics , 219-23.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Conference held: Leicester, UK, 10-13 July, 1995 Organisation: IEEE Dielectrics and Insulation Society |
| ISBNs: | 0780320409 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 254065 |
| Date Deposited: | 13 Oct 2000 |
| Last Modified: | 02 Mar 2012 12:58 |
| Contributors: | Blacker, R. S. (Author) Vaughan, A. S. (Author) Bassett, D. C. (Author) Moody, S. M. (Author) Hampton, R. N. (Author) |
| Date: | 1995 |
| Additional Information: | Conference held: Leicester, UK, 10-13 July, 1995 Organisation: IEEE Dielectrics and Insulation Society |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/254065 |
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