Degradation of dodecylbenzene under conditions of high electric field
Huynh, R. L., Davis, F. J., Patel, D. and Vaughan, A. S. (2000) Degradation of dodecylbenzene under conditions of high electric field. Proceedings of 8th International Conference on Dielectric Materials, Measurements and Applications , 224-9.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Conference held: Edinburgh, UK, 17-21 September, 2000 Organisation: Institution of Electrical Engineers |
| ISBNs: | 0852967306 |
| ISSNs: | 0537-9989 |
| Divisions: | Faculty of Physical Sciences and Engineering > Electronics and Computer Science Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE |
| Item ID: | 254075 |
| Date Deposited: | 13 Oct 2000 |
| Last Modified: | 02 Mar 2012 14:03 |
| Contributors: | Huynh, R. L. (Author) Davis, F. J. (Author) Patel, D. (Author) Vaughan, A. S. (Author) |
| Date: | September 2000 |
| Additional Information: | Conference held: Edinburgh, UK, 17-21 September, 2000 Organisation: Institution of Electrical Engineers |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 0 |
| URI: | http://eprints.soton.ac.uk/id/eprint/254075 |
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