Process variation independent built-in current sensor for analogue built-in self-test
Process variation independent built-in current sensor for analogue built-in self-test
A new design of built-in current sensor for dynamic supply current testing of analogue integrated circuits is proposed. The sensor has been designed and realized with AMS 0.8 CYE CMOS technology. The sensor occupies 0.019mm2 silicon area, where this area is almost as big as a simple two-stage CMOS opamp. Unlike previously published sensors, this new built-in current sensor is process variation independent.
IV 398-401
Kilic, Yavuz
a69ba7cd-0ab3-4f59-a863-5945028fa851
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
May 2001
Kilic, Yavuz
a69ba7cd-0ab3-4f59-a863-5945028fa851
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Kilic, Yavuz and Zwolinski, Mark
(2001)
Process variation independent built-in current sensor for analogue built-in self-test.
International Symposium on Circuits and Systems.
.
Record type:
Conference or Workshop Item
(Other)
Abstract
A new design of built-in current sensor for dynamic supply current testing of analogue integrated circuits is proposed. The sensor has been designed and realized with AMS 0.8 CYE CMOS technology. The sensor occupies 0.019mm2 silicon area, where this area is almost as big as a simple two-stage CMOS opamp. Unlike previously published sensors, this new built-in current sensor is process variation independent.
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Published date: May 2001
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Organisation: IEEE
Venue - Dates:
International Symposium on Circuits and Systems, 2001-04-30
Organisations:
EEE
Identifiers
Local EPrints ID: 254251
URI: http://eprints.soton.ac.uk/id/eprint/254251
PURE UUID: e410e89f-f0ab-4208-9e4f-1ee9d0541f63
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Date deposited: 01 May 2002
Last modified: 08 Jan 2022 02:34
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Contributors
Author:
Yavuz Kilic
Author:
Mark Zwolinski
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