Closeness Measurement in Concurrent Analogue Fault Simulation
Closeness Measurement in Concurrent Analogue Fault Simulation
A new approach for transient concurrent analogue fault simulation is presented. Metrics for measuring the closeness of simulation responses are discussed. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.
Zwolinski, M.
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Kilic, Y.
47444b82-52f5-48e8-b219-01009e81e0ea
October 2000
Zwolinski, M.
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Kilic, Y.
47444b82-52f5-48e8-b219-01009e81e0ea
Zwolinski, M. and Kilic, Y.
(2000)
Closeness Measurement in Concurrent Analogue Fault Simulation.
International Conference on Signals and Electronic Systems (ICSES).
Record type:
Conference or Workshop Item
(Other)
Abstract
A new approach for transient concurrent analogue fault simulation is presented. Metrics for measuring the closeness of simulation responses are discussed. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.
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Published date: October 2000
Venue - Dates:
International Conference on Signals and Electronic Systems (ICSES), 2000-09-30
Organisations:
EEE
Identifiers
Local EPrints ID: 255731
URI: http://eprints.soton.ac.uk/id/eprint/255731
PURE UUID: 4d9791f8-49ef-4b19-b70c-cbd7226a652f
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Date deposited: 17 Apr 2001
Last modified: 11 Dec 2021 02:43
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Contributors
Author:
M. Zwolinski
Author:
Y. Kilic
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