Closeness Measurement in Concurrent Analogue Fault Simulation

Zwolinski, M. and Kilic, Y. (2000) Closeness Measurement in Concurrent Analogue Fault Simulation. International Conference on Signals and Electronic Systems (ICSES)


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A new approach for transient concurrent analogue fault simulation is presented. Metrics for measuring the closeness of simulation responses are discussed. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Divisions : Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 255731
Accepted Date and Publication Date:
October 2000Published
Date Deposited: 17 Apr 2001
Last Modified: 31 Mar 2016 13:55
Further Information:Google Scholar

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