Closeness Measurement in Concurrent Analogue Fault Simulation
Zwolinski, M. and Kilic, Y. (2000) Closeness Measurement in Concurrent Analogue Fault Simulation. International Conference on Signals and Electronic Systems (ICSES)
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A new approach for transient concurrent analogue fault simulation is presented. Metrics for measuring the closeness of simulation responses are discussed. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.
|Item Type:||Conference or Workshop Item (UNSPECIFIED)|
|Divisions:||Faculty of Physical and Applied Science > Electronics and Computer Science > EEE
|Date Deposited:||17 Apr 2001|
|Last Modified:||01 Mar 2012 10:43|
|Contributors:||Zwolinski, M. (Author)
Kilic, Y. (Author)
|Further Information:||Google Scholar|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
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