The inadequacy of the stuck-at model for testing MOS LSI circuits


Burgess, N. and Damper, R. I. (1984) The inadequacy of the stuck-at model for testing MOS LSI circuits. Software and Microsystems, 3, 30-36.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Comms, Signal Processing & Control
ePrint ID: 256197
Date Deposited: 22 Dec 2001
Last Modified: 27 Mar 2014 19:58
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256197

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