The inadequacy of the stuck-at model for testing MOS LSI circuits
Burgess, N. and Damper, R. I. (1984) The inadequacy of the stuck-at model for testing MOS LSI circuits. Software and Microsystems, 3, 30-36.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Comms, Signal Processing & Control |
| Item ID: | 256197 |
| Date Deposited: | 22 Dec 2001 |
| Last Modified: | 02 Mar 2012 11:57 |
| Contributors: | Burgess, N. (Author) Damper, R. I. (Author) |
| Date: | 1984 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/256197 |
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