Applications of built-in test equipment within large systems
Moore, W.R. and Damper, R.I. (1986) Applications of built-in test equipment within large systems. IEE Proceedings, Part G (Electronic Circuits and Systems), 133, 221-226.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Comms, Signal Processing & Control |
| Item ID: | 256206 |
| Date Deposited: | 27 Dec 2001 |
| Last Modified: | 02 Mar 2012 13:40 |
| Contributors: | Moore, W.R. (Author) Damper, R.I. (Author) |
| Date: | 1986 |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 1 |
| URI: | http://eprints.soton.ac.uk/id/eprint/256206 |
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