Damper, R.I. and Burgess, N. (1987) MOS test pattern generation using path algebras. IEEE Transactions on Computers, C-36, 1123-1128.
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Published date: 1987
Organisations:
Southampton Wireless Group
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Local EPrints ID: 256211
URI: http://eprints.soton.ac.uk/id/eprint/256211
PURE UUID: ba6a9f99-ccb6-4bd1-a4e7-07ff510393eb
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Date deposited: 27 Dec 2001
Last modified: 10 Dec 2021 20:42
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Author:
R.I. Damper
Author:
N. Burgess
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