MOS test pattern generation using path algebras
Damper, R.I. and Burgess, N. (1987) MOS test pattern generation using path algebras. IEEE Transactions on Computers, C-36, 1123-1128.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Comms, Signal Processing & Control |
| Item ID: | 256211 |
| Date Deposited: | 27 Dec 2001 |
| Last Modified: | 02 Mar 2012 13:18 |
| Contributors: | Damper, R.I. (Author) Burgess, N. (Author) |
| Date: | 1987 |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 13 |
| URI: | http://eprints.soton.ac.uk/id/eprint/256211 |
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