Physical faults in MOS circuits and their coverage by different fault models
Burgess, N., Damper, R.I., Totton, K.A.E. and Shaw, S.J. (1988) Physical faults in MOS circuits and their coverage by different fault models. IEE Proceedings, Part E (Computers and Digital Techniques), 135, 1-9.
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|Divisions :||Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Southampton Wireless Group
|Accepted Date and Publication Date:||
|Date Deposited:||27 Dec 2001|
|Last Modified:||31 Mar 2016 13:56|
|Further Information:||Google Scholar|
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