Physical faults in MOS circuits and their coverage by different fault models
Burgess, N., Damper, R.I., Totton, K.A.E. and Shaw, S.J. (1988) Physical faults in MOS circuits and their coverage by different fault models. IEE Proceedings, Part E (Computers and Digital Techniques), 135, 1-9.
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|Divisions:||Faculty of Physical and Applied Science > Electronics and Computer Science > Comms, Signal Processing & Control
|Date Deposited:||27 Dec 2001|
|Last Modified:||02 Mar 2012 12:19|
|Contributors:||Burgess, N. (Author)
Damper, R.I. (Author)
Totton, K.A.E. (Author)
Shaw, S.J. (Author)
|Further Information:||Google Scholar|
|ISI Citation Count:||8|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
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