Physical faults in MOS circuits and their coverage by different fault models


Burgess, N., Damper, R.I., Totton, K.A.E. and Shaw, S.J. (1988) Physical faults in MOS circuits and their coverage by different fault models. IEE Proceedings, Part E (Computers and Digital Techniques), 135, 1-9.

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Item Type: Article
Divisions : Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Southampton Wireless Group
ePrint ID: 256213
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1988Published
Date Deposited: 27 Dec 2001
Last Modified: 31 Mar 2016 13:56
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256213

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