Physical faults in MOS circuits and their coverage by different fault models


Burgess, N., Damper, R.I., Totton, K.A.E. and Shaw, S.J. (1988) Physical faults in MOS circuits and their coverage by different fault models. IEE Proceedings, Part E (Computers and Digital Techniques), 135, 1-9.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Comms, Signal Processing & Control
ePrint ID: 256213
Date Deposited: 27 Dec 2001
Last Modified: 27 Mar 2014 19:58
Further Information:Google Scholar
ISI Citation Count:8
URI: http://eprints.soton.ac.uk/id/eprint/256213

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