Path testing of MOS circuits


Damper, R. I. and Burgess, N. (1989) Path testing of MOS circuits. Design and Test Techniques for VLSI and WSI Circuits Peter Peregrinus, 158-183.

Download

Full text not available from this repository.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Address: London, UK
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Southampton Wireless Group
ePrint ID: 256248
Date :
Date Event
1989Published
Date Deposited: 07 Jan 2002
Last Modified: 31 Mar 2016 13:56
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256248

Actions (login required)

View Item View Item