Damper, R. I. and Burgess, N. (1989) Path testing of MOS circuits. Massara, R. E. (ed.) Design and Test Techniques for VLSI and WSI Circuits. pp. 158-183 .
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Published date: 1989
Additional Information:
Address: London, UK
Venue - Dates:
Design and Test Techniques for VLSI and WSI Circuits, 1989-01-01
Organisations:
Southampton Wireless Group
Identifiers
Local EPrints ID: 256248
URI: http://eprints.soton.ac.uk/id/eprint/256248
PURE UUID: 48393cd1-ec38-41da-9026-85984dadcb1f
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Date deposited: 07 Jan 2002
Last modified: 10 Dec 2021 20:42
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Contributors
Author:
R. I. Damper
Author:
N. Burgess
Editor:
R. E. Massara
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