Path testing of MOS circuits

Damper, R. I. and Burgess, N. (1989) Path testing of MOS circuits. Design and Test Techniques for VLSI and WSI Circuits Peter Peregrinus, 158-183.


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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Address: London, UK
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Southampton Wireless Group
ePrint ID: 256248
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Date Deposited: 07 Jan 2002
Last Modified: 31 Mar 2016 13:56
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