Failure mechanisms and fault models for MOS testing
Damper, R. I. (1985) Failure mechanisms and fault models for MOS testing. Silicon Design, (May), 4-5.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Comms, Signal Processing & Control |
| Item ID: | 256249 |
| Date Deposited: | 07 Jan 2002 |
| Last Modified: | 01 Mar 2012 10:46 |
| Contributors: | Damper, R. I. (Author) |
| Date: | 1985 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/256249 |
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