Failure mechanisms and fault models for MOS testing


Damper, R. I. (1985) Failure mechanisms and fault models for MOS testing. Silicon Design, (May), 4-5.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Comms, Signal Processing & Control
ePrint ID: 256249
Date Deposited: 07 Jan 2002
Last Modified: 27 Mar 2014 19:58
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256249

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