Path testing of MOS circuits
Damper, R. I. and Burgess, N. (1985) Path testing of MOS circuits. IEE Colloquium on Design for Testability , 11.1-11.5.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Address: London, UK |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Comms, Signal Processing & Control |
| Item ID: | 256254 |
| Date Deposited: | 07 Jan 2002 |
| Last Modified: | 02 Mar 2012 11:57 |
| Contributors: | Damper, R. I. (Author) Burgess, N. (Author) |
| Date: | 1985 |
| Additional Information: | Address: London, UK |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/256254 |
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