Burgess, N. (1986) Fault-oriented testing of MOS circuits. University of Southampton, Electronics and Information Engineering : Faculty of Engineering and Applied Science, Doctoral Thesis.
Record type:
Thesis
(Doctoral)
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More information
Published date: 1986
Organisations:
University of Southampton, Southampton Wireless Group
Identifiers
Local EPrints ID: 256260
URI: http://eprints.soton.ac.uk/id/eprint/256260
PURE UUID: f9aa4e44-ace9-424f-8534-7069242bfc6a
Catalogue record
Date deposited: 27 Mar 2003
Last modified: 10 Dec 2021 20:42
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Contributors
Author:
N. Burgess
Thesis advisor:
R.I. Damper
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