Fault-Oriented Testing of MOS Circuits
Burgess, N. (1986) Fault-Oriented Testing of MOS Circuits. University of Southampton, Electronics and Information Engineering : Faculty of Engineering and Applied Science, Doctoral Thesis .
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| Item Type: | Thesis (Doctoral) |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Comms, Signal Processing & Control |
| Item ID: | 256260 |
| Date Deposited: | 27 Mar 2003 |
| Last Modified: | 02 Mar 2012 14:02 |
| Contributors: | Burgess, N. (Author) Damper, R. I. (Editor) |
| Date: | 1986 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/256260 |
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