Other #256485


Straube, U.N., Waite, A.M., Evans, A.G.R., Nejim, A. and Hemment, P.L.F. (2001) UNSPECIFIED Electronics Letters, 37, (25)

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Description/Abstract

SiGe heterostructure MOSFETS have the potential for improved channel mobility over Si only devices. It is shown that fabrication by implantation leads to inferior devices in contrast to previously reported work. A simultaneous decrease of the drain current and increase of the interface state density has been observed

Item Type: Other
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 256485
Date Deposited: 05 Apr 2002
Last Modified: 02 Mar 2012 12:39
Contributors: Straube, U.N. (Author)
Waite, A.M. (Author)
Evans, A.G.R. (Author)
Nejim, A. (Author)
Hemment, P.L.F. (Author)
Date: December 2001
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256485

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