Reliability of circuit-level simulation,

Nichols, K.G., Kazmierski, T J, Zwolinski, M and Brown, A D (1993) Reliability of circuit-level simulation,. Proc. IEE Colloquium on SPICE IEE.


Full text not available from this repository.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Address: London
Divisions : Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 256535
Accepted Date and Publication Date:
June 1993Published
Date Deposited: 26 Apr 2002
Last Modified: 31 Mar 2016 13:57
Further Information:Google Scholar

Actions (login required)

View Item View Item