Reliability of circuit-level simulation,
Nichols, K.G., Kazmierski, T J, Zwolinski, M and Brown, A D (1993) Reliability of circuit-level simulation,. Proc. IEE Colloquium on SPICE IEE.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Address: London |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 256535 |
| Date Deposited: | 26 Apr 2002 |
| Last Modified: | 02 Mar 2012 13:18 |
| Contributors: | Nichols, K.G. (Author) Kazmierski, T J (Author) Zwolinski, M (Author) Brown, A D (Author) |
| Date: | June 1993 |
| Additional Information: | Address: London |
| Status: | Published |
| Publisher: | IEE |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/256535 |
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