Reliability of circuit-level simulation,


Nichols, K.G., Kazmierski, T J, Zwolinski, M and Brown, A D (1993) Reliability of circuit-level simulation,. Proc. IEE Colloquium on SPICE IEE.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Address: London
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 256535
Date Deposited: 26 Apr 2002
Last Modified: 27 Mar 2014 19:58
Publisher: IEE
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256535

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