A method to determine the ageing rate of thick-film PZT layers
Glynne-Jones, P., Beeby, S.P. and White, N.M. (2001) A method to determine the ageing rate of thick-film PZT layers. Measurement Science and Technology, 12, (6), 663-670. (doi:10.1088/0957-0233/12/6/302).
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Description/Abstract
Screen printed lead zirconate titanate (PZT) layers offer possibilities for both sensing and actuation applications. PZT materials are known to suffer a long-term ageing process that can affect their performance as functional materials. Measuring the rate of this ageing on thick-film piezoelectric materials is difficult due to the presence of a substrate, and suitable methods have not been reported in the literature. A technique for measuring the ageing rate of the d31 coefficient is described in this paper, and includes a composite test structure based on a steel substrate. The d31 coefficient is found to age at −4.4% per time decade after polarization with no external stresses (for PZT-5H, a soft piezoelectric material). A method is also presented for measuring the ageing of the dielectric constant, K33, and this is found to have an ageing rate of −1.34% per time decade. Techniques for exploring cyclical stress induced ageing of d31 are further described, and an interesting linear ageing characteristic is demonstrated.
| Item Type: | Article |
|---|---|
| ISSNs: | 0957-0233 (print) 1361-6501 (electronic) |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 256616 |
| Date Deposited: | 02 Mar 2005 |
| Last Modified: | 14 Jun 2012 15:17 |
| Contributors: | Glynne-Jones, P. (Author) Beeby, S.P. (Author) White, N.M. (Author) |
| Date: | June 2001 |
| Status: | Published |
| Publisher: | IOP Publishing |
| Further Information: | Google Scholar |
| ISI Citation Count: | 5 |
| URI: | http://eprints.soton.ac.uk/id/eprint/256616 |
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