A method to determine the ageing rate of thick-film PZT layers
Glynne-Jones, P., Beeby, S.P. and White, N.M. (2001) A method to determine the ageing rate of thick-film PZT layers. Measurement Science and Technology, 12, (6), 663-670. (doi:10.1088/0957-0233/12/6/302).
Screen printed lead zirconate titanate (PZT) layers offer possibilities for both sensing and actuation applications. PZT materials are known to suffer a long-term ageing process that can affect their performance as functional materials. Measuring the rate of this ageing on thick-film piezoelectric materials is difficult due to the presence of a substrate, and suitable methods have not been reported in the literature. A technique for measuring the ageing rate of the d31 coefficient is described in this paper, and includes a composite test structure based on a steel substrate. The d31 coefficient is found to age at −4.4% per time decade after polarization with no external stresses (for PZT-5H, a soft piezoelectric material). A method is also presented for measuring the ageing of the dielectric constant, K33, and this is found to have an ageing rate of −1.34% per time decade. Techniques for exploring cyclical stress induced ageing of d31 are further described, and an interesting linear ageing characteristic is demonstrated.
|Subjects:||T Technology > TK Electrical engineering. Electronics Nuclear engineering|
|Divisions:||Faculty of Physical and Applied Science > Electronics and Computer Science > EEE
|Date Deposited:||02 Mar 2005|
|Last Modified:||14 Jun 2012 15:17|
|Contributors:||Glynne-Jones, P. (Author)
Beeby, S.P. (Author)
White, N.M. (Author)
|Further Information:||Google Scholar|
|ISI Citation Count:||5|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
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