Micromachined silicon resonant strain gauges fabricated using SOI wafer technology


Beeby, SP, Ensell, G, Tudor, MJ, White, NM and Baker, BR (2000) Micromachined silicon resonant strain gauges fabricated using SOI wafer technology. Journal of Microelectromechanical Systems (JMEMS), 9, (1), 104-111.

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Item Type: Article
ISSNs: 1057-7157
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > EEE
Item ID: 256654
Date Deposited: 10 Jul 2002
Last Modified: 26 Apr 2013 02:43
Contributors: Beeby, SP (Author)
Ensell, G (Author)
Tudor, MJ (Author)
White, NM (Author)
Baker, BR (Author)
Date: March 2000
Status: Published
Publisher: IEEE
Further Information:Google Scholar
ISI Citation Count:12
URI: http://eprints.soton.ac.uk/id/eprint/256654

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