Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours


Kim, Dong-Hun, Park, Il-Han., Shin, Myoung-Chul and Sykulski, J.K. (2002) Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours. CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Perugia, Italy, 16 - 19 Jun 2002. , 295-295.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Event Dates: 16-19 June 2002
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 256757
Date Deposited: 13 Sep 2002
Last Modified: 27 Mar 2014 19:58
Further Information:Google Scholar
ISI Citation Count:4
URI: http://eprints.soton.ac.uk/id/eprint/256757

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